BIB-VERSION:: CS-TR-v2.0
          ID:: STAN//CSL-TR-96-703
       ENTRY:: October 10, 1996
ORGANIZATION:: Stanford University, Computer Systems Laboratory
       TITLE:: Test Point Insertion for Non-Feedback Bridging Faults
        TYPE:: Technical Report
      AUTHOR:: Touba, Nur A.
      AUTHOR:: McCluskey, Edward J.
        DATE:: August 1996
       PAGES:: 21
    ABSTRACT:: This paper studies pseudo-random pattern testing of bridging
               faults. Although bridging faults are generally more random
               pattern testable than stuck-at faults, examples are shown to
               illustrate that some bridging faults can be much less random
               pattern testable than stuck-at faults. A fast method for
               identifying these random-pattern-resistant bridging faults is
               described. It is shown that state-of-the-art test point
               insertion techniques, which are based on the stuck-at fault
               model, are inadequate. Data is presented which indicates that
               even after inserting test points that result in 100% single
               stuck-at fault coverage, many bridging faults are still not
               detected. A test point insertion procedure that targets both
               single stuck-at faults and non-feedback bridging faults is
               presented. It is shown that by considering both types of
               faults when selecting the location for test points, higher
               fault coverage can be obtained with little or no increase in
               overhead. Thus, the test point insertion procedure described
               here is a low-cost way to improve the quality of built-in
               self-test. While this paper considers only non-feedback
               bridging faults, the techniques that are described can be
               applied to feedback bridging faults in a straightforward
               manner.
       NOTES:: [Adminitrivia V1/Prg/19961010]
         END:: STAN//CSL-TR-96-703