BIB-VERSION:: CS-TR-v2.0
          ID:: STAN//CSL-TR-80-182
       ENTRY:: December 01, 1994
ORGANIZATION:: Stanford University, Computer Systems Laboratory
       TITLE:: DESIGN FOR AUTONOMOUS TEST
        TYPE:: Technical Report
      AUTHOR:: McCluskey, Edward J.
      AUTHOR:: Bozorgui-Nesbat, Saied
        DATE:: June 1981
       PAGES:: 51
    ABSTRACT:: A technique for modifying networks so that they are capable
               of self test is presented. The major innovation is
               partitioning the network into subnetworks with sufficiently
               few inputs that exhaustive testing of the subnetworks is
               possible.

               Procedures for reconfiguring the existing registers into
               modified linear feedback registers (LFSR's) which apply the
               exhaustive (not pseudo-random) test patterns or convert the
               responses into signatures are described. No fault models or
               test pattern generation programs are required. A method to
               modify CMOS circuits so that exhaustive testing can be used
               even when stuck-open faults must be detected is described. A
               detailed example using the 74181 ALU is presented.
       NOTES:: [Adminitrivia V1/Prg/19941201]
         END:: STAN//CSL-TR-80-182