BIB-VERSION:: CS-TR-v2.0
          ID:: STAN//CSL-TR-79-179
       ENTRY:: December 01, 1994
ORGANIZATION:: Stanford University, Computer Systems Laboratory
       TITLE:: TESTABILITY CONSIDERATIONS IN MICROPROCESSOR-BASED DESIGN
        TYPE:: Technical Report
      AUTHOR:: Hayes, John P.
      AUTHOR:: McCluskey, Edward J.
        DATE:: November 1979
       PAGES:: 45
    ABSTRACT:: This report contains a survey of testability conditions in
               microprocessor-based design. General issues of testability,
               testing methods, and fault modeling are presented. Specific
               techniques of testing and designing for testable
               microprocessor-based systems are discussed.
       NOTES:: [Adminitrivia V1/Prg/19941201]
         END:: STAN//CSL-TR-79-179