BIB-VERSION:: CS-TR-v2.0
          ID:: STAN//CSL-TR-78-157
       ENTRY:: December 01, 1994
ORGANIZATION:: Stanford University, Computer Systems Laboratory
       TITLE:: SYNDROME-TESTABLE DESIGN OF COMBINATIONAL CIRCUITS
        TYPE:: Technical Report
      AUTHOR:: Savir, Jacob
        DATE:: October 1978
       PAGES:: 32
    ABSTRACT:: Classical testing of combinational circuits requires a list
               of the fault-free responses of the circuit to the test set.
               For most practical circuits implemented today the large
               storage requirement for such a list make such a test
               procedure very expensive.

               In this paper we describe a method of designing combinational
               circuits in such a way that their test procedure will require
               the knowledge of only one characteristic of the fault-free
               circuit, called the syndrome. This solves the storage problem
               associated with the test procedure. It is shown that the
               syndrome-testable design is inexpensive and can be easily
               implemented by the logic designer.
       NOTES:: [Adminitrivia V1/Prg/19941201]
         END:: STAN//CSL-TR-78-157