BIB-VERSION:: CS-TR-v2.0
          ID:: STAN//CSL-TR-76-120
       ENTRY:: December 01, 1994
ORGANIZATION:: Stanford University, Computer Systems Laboratory
       TITLE:: DETECTION OF INTERMITTENT FAULTS IN SEQUENTIAL CIRCUITS
        TYPE:: Technical Report
      AUTHOR:: Savir, Jacob
        DATE:: March 1978
       PAGES:: 34
    ABSTRACT:: Testing for intermittent faults in digital circuits has been
               given significant attention in the past few years. However,
               very little theoretical work was done regarding their
               detection in sequential circuits.

               This paper shows that the testing properties of intermittent
               faults in sequential circuits can be studied by means of a
               probabilistic automaton. The evaluation and derivation of
               optimal intermittent fault detection experiments in
               sequential circuits is done by creating a product state table
               from the faulty and fault-free versions of the circuit under
               test. Both deterministic and random test procedures are
               discussed. The underlying optimality criterion maximizes the
               probability of fault detection.
       NOTES:: [Adminitrivia V1/Prg/19941201]
         END:: STAN//CSL-TR-76-120