Report Number: CSL-TR-80-182
Institution: Stanford University, Computer Systems Laboratory
Title: Design for autonomous test
Author: McCluskey, Edward J.
Author: Bozorgui-Nesbat, Saied
Date: June 1981
Abstract: A technique for modifying networks so that they are capable
of self test is presented. The major innovation is
partitioning the network into subnetworks with sufficiently
few inputs that exhaustive testing of the subnetworks is
possible.
Procedures for reconfiguring the existing registers into
modified linear feedback registers (LFSR's) which apply the
exhaustive (not pseudo-random) test patterns or convert the
responses into signatures are described. No fault models or
test pattern generation programs are required. A method to
modify CMOS circuits so that exhaustive testing can be used
even when stuck-open faults must be detected is described. A
detailed example using the 74181 ALU is presented.
http://i.stanford.edu/pub/cstr/reports/csl/tr/80/182/CSL-TR-80-182.pdf