Report Number: CSL-TR-79-179
Institution: Stanford University, Computer Systems Laboratory
Title: Testability considerations in microprocessor-based design
Author: Hayes, John P.
Author: McCluskey, Edward J.
Date: November 1979
Abstract: This report contains a survey of testability conditions in microprocessor-based design. General issues of testability, testing methods, and fault modeling are presented. Specific techniques of testing and designing for testable microprocessor-based systems are discussed.