Report Number: CSL-TR-78-157
Institution: Stanford University, Computer Systems Laboratory
Title: Syndrome-testable design of combinational circuits
Author: Savir, Jacob
Date: October 1978
Abstract: Classical testing of combinational circuits requires a list
of the fault-free responses of the circuit to the test set.
For most practical circuits implemented today the large
storage requirement for such a list make such a test
procedure very expensive.
In this paper we describe a method of designing combinational
circuits in such a way that their test procedure will require
the knowledge of only one characteristic of the fault-free
circuit, called the syndrome. This solves the storage problem
associated with the test procedure. It is shown that the
syndrome-testable design is inexpensive and can be easily
implemented by the logic designer.