Report Number: CSL-TR-76-120
Institution: Stanford University, Computer Systems Laboratory
Title: Detection of intermittent faults in sequential circuits
Author: Savir, Jacob
Date: March 1978
Abstract: Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits. This paper shows that the testing properties of intermittent faults in sequential circuits can be studied by means of a probabilistic automaton. The evaluation and derivation of optimal intermittent fault detection experiments in sequential circuits is done by creating a product state table from the faulty and fault-free versions of the circuit under test. Both deterministic and random test procedures are discussed. The underlying optimality criterion maximizes the probability of fault detection.
http://i.stanford.edu/pub/cstr/reports/csl/tr/76/120/CSL-TR-76-120.pdf